Park Systems

Home
South Korea
Suwon
Park Systems

Enabling Nanoscale Advances
Park Systems has always strived to push the limits of innovation in scan

Park Systems, formally PSIA, is an innovative leader in atomic force microscopy. We are committed to providing accurate yet easy to use AFMs. With features like True Non-Contact™ mode and automated software, we continue to achieve our goals of improving our products. Headquartered in South Korea, Park Systems also hosts offices in the United States, Germany, China, Mexico, Singapore, India and Japan.

07/08/2026

At 𝗕𝗲𝗻𝗴𝗮𝗹𝘂𝗿𝘂 𝗜𝗻𝗱𝗶𝗮 𝗡𝗮𝗻𝗼 𝟮𝟬𝟮𝟲, Park Systems India connected with key researchers and innovators from Bengaluru’s fast-growing deep-tech and academic ecosystem, a key hub for turning nanoscale research into real-world impact.

Park Systems supports this progress with advanced 𝗔𝘁𝗼𝗺𝗶𝗳 𝗙𝗼𝗿𝗰𝗲 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝗲𝘀 (𝗔𝗙𝗠), 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝗲𝘀 (𝗗𝗛𝗠), 𝗮𝗻𝗱 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 (𝗜𝗦𝗘) for precise materials characterization.

A key highlight was the 𝗣𝗮𝗿𝗸 𝗙𝗫𝟮𝟬𝟬, designed for samples up to 200 mm. Its low-noise, high-stability platform and automated workflows enable accurate, high-resolution metrology with greater productivity.

Thank you to everyone who visited our booth!

06/08/2026

𝗪𝗵𝘆 𝗱𝗼𝗲𝘀 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗼𝗻 𝗺𝗮𝘁𝘁𝗲𝗿 𝗶𝗻 𝗿𝗲𝘀𝗲𝗮𝗿𝗰𝗵 𝗔𝗙𝗠?
The ability of the Park Systems’ FX series AFMs to change the electrical configuration of the AFM for conductive and KPFM means these experiments can be performed automatically and with no need to manually reconfigure hardware and lose your location on the sample!

In this video we show how FX series AFMs can be used to map the topography and contact potential difference of a marginally twisted (~0 degrees) bilayer graphene on hBN using Kelvin probe force microscopy (KPFM) before switching to conductive AFM to measure moiré patterns.

💡𝗙𝗶𝗻𝗱 𝗼𝘂𝘁 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗵𝗼𝘄 𝗼𝘂𝗿 𝗙𝗫 𝘀𝗲𝗿𝗶𝗲𝘀 𝗶𝗻𝘀𝘁𝗿𝘂𝗺𝗲𝗻𝘁𝘀 𝗺𝗮𝗸𝗲 𝗔𝗙𝗠 𝗲𝗮𝘀𝘆 𝗵𝗲𝗿𝗲: https://okt.to/8RjWb1

Video caption: In this video we switch between KPFM and C-AFM on marginally (~0 degrees) twisted bilayer graphene on hBN using our FX200 automatic AFM.

04/08/2026

Meet Park FX40: 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗲𝗱 𝗔𝗙𝗠 𝗯𝘂𝗶𝗹𝘁 𝘁𝗼 𝗺𝗼𝘃𝗲 𝗮𝘀 𝗳𝗮𝘀𝘁 𝗮𝘀 𝘆𝗼𝘂𝗿 𝗿𝗲𝘀𝗲𝗮𝗿𝗰𝗵.
From automatic probe exchange to laser beam alignment and SmartScan™ optimization, FX40 takes the friction out of daily AFM workflows, so users can spend less time setting up and more time getting results.

You measure small samples but achieve big performance. We automate the process from the start.

💡𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿 𝗙𝗫𝟰𝟬: https://okt.to/6OdRLW

04/08/2026

𝗪𝗵𝗶𝗰𝗵 𝗡𝗔𝗡𝗢𝘀𝗰𝗶𝗲𝗻𝘁𝗶𝗳𝗶𝗰 𝗦𝘆𝗺𝗽𝗼𝘀𝗶𝘂𝗺 𝟮𝟬𝟮𝟲 𝘀𝘁𝗼𝗽 𝗶𝘀 𝗰𝗹𝗼𝘀𝗲𝘀𝘁 𝘁𝗼 𝘆𝗼𝘂?
Park Systems is supporting five global events created for the SPM, nanoscience, and optical microscopy communities. Join researchers and industry experts for application-focused talks, live demonstrations, hands-on learning, poster sessions, and new opportunities to connect.

📍 𝗪𝗵𝗲𝗿𝗲 𝘁𝗼 𝗷𝗼𝗶𝗻 𝘂𝘀:
August 20–21 | Park Systems HQ | Gwacheon, South Korea
September 9–11 | Charles University | Prague, Czech Republic
September 29–30 | Northeastern University | Boston, USA
October 14 | Universiti Malaya | Kuala Lumpur, Malaysia
October 29 | University of Tokyo | Tokyo, Japan

Explore live demonstrations of 𝗔𝘁𝗼𝗺𝗶𝗰 𝗙𝗼𝗿𝗰𝗲 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗮𝗻𝗱 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 and how they are advancing nanoscale imaging and surface analysis.

💡𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝗳𝗼𝗿 𝗡𝗦𝗦 𝗦𝘆𝗺𝗽𝗼𝘀𝗶𝘂𝗺 𝗶𝗻 𝘆𝗼𝘂𝗿 𝗿𝗲𝗴𝗶𝗼𝗻: https://okt.to/a4A1ue

03/08/2026

𝗦𝗰𝗶𝗲𝗻𝗰𝗲 𝗱𝗼𝗲𝘀𝗻’𝘁 𝘁𝗮𝗸𝗲 𝗮 𝗯𝗿𝗲𝗮𝗸. 𝗧𝗿𝘂𝗲 𝗹𝗮𝗯 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗶𝗼𝗻 𝗰𝗮𝗻’𝘁 𝘄𝗮𝗶𝘁 𝗳𝗼𝗿 𝗺𝗮𝗻𝘂𝗮𝗹 𝗔𝗙𝗠 𝘁𝗶𝗽 𝗿𝗲𝗹𝗼𝗮𝗱𝘀.
In today’s self-driving labs, digital intelligence generates hypotheses at unprecedented speeds. Yet, a critical hardware gap remains: high-resolution AFM characterization requires sharp probes. When they inevitably break or contaminate, human intervention is forced.

The autonomous cycle breaks. Hours of idle time follow. Software is useless without complete physical agency.

The Park FX Series (𝗙𝗫𝟰𝟬 • 𝗙𝗫𝟮𝟬𝟬 • 𝗙𝗫𝟯𝟬𝟬) eliminates this bottleneck. Built for true 24/7 autonomy, these systems detect, respond to, and recover from tip issues without human input.

𝗞𝗲𝘆 𝗳𝗲𝗮𝘁𝘂𝗿𝗲𝘀 𝗲𝗻𝗮𝗯𝗹𝗶𝗻𝗴 𝘁𝗿𝘂𝗲 𝗮𝘂𝘁𝗼𝗻𝗼𝗺𝘆:
🔸𝗙𝘂𝗹𝗹𝘆 𝗮𝘂𝘁𝗼𝗻𝗼𝗺𝗼𝘂𝘀 𝗽𝗿𝗼𝗯𝗲 𝗲𝘅𝗰𝗵𝗮𝗻𝗴𝗲: ~2 min replacement and full laser alignment.
🔸𝗤𝗥-𝗰𝗼𝗱𝗲𝗱 𝘁𝗿𝗮𝗰𝗸𝗶𝗻𝗴: Full usage history across up to 16 slots.
🔸𝗟𝗶𝘃𝗲 𝗵𝗲𝗮𝗹𝘁𝗵 𝗺𝗼𝗻𝗶𝘁𝗼𝗿𝗶𝗻𝗴: Auto-detection of tip degradation or contamination.
🔸𝗦𝘁𝗲𝗽𝗦𝗰𝗮𝗻™: Unsupervised, high-throughput measurements from small samples to 300 mm wafers.

The result is ~15+ hours of continuous scanning in a 24-hour cycle. No idle time. No human pauses. Just a continuous data pipeline feeding real physics into your materials discovery. Challenge us in a live demo!

💡𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗣𝗮𝗿𝗸 𝗙𝗫 𝗦𝗲𝗿𝗶𝗲𝘀 𝗔𝗙𝗠𝘀 𝗳𝗼𝗿 𝘀𝗺𝗮𝗹𝗹 𝗮𝗻𝗱 𝗹𝗮𝗿𝗴𝗲 𝘀𝗮𝗺𝗽𝗹𝗲 𝗿𝗲𝘀𝗲𝗮𝗿𝗰𝗵: https://okt.to/lLeHYS

01/08/2026

Thank you to everyone who made the 𝟮𝟬𝟮𝟲 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗦𝗼𝘂𝘁𝗵𝗲𝗮𝘀𝘁 𝗔𝘀𝗶𝗮 & 𝗜𝗻𝗱𝗶𝗮 𝗔𝗴𝗲𝗻𝘁 𝗠𝗲𝗲𝘁𝗶𝗻𝗴 a tremendous success!
Over the past few days, we had the opportunity to strengthen partnerships, exchange valuable market insights, explore the latest innovations, and align our strategies for the exciting opportunities ahead. It was an inspiring gathering filled with meaningful discussions, collaboration, and a shared commitment to delivering cutting-edge metrology solutions across Southeast Asia, India and Middel East regions.

A heartfelt thank you to all our dedicated agents and the Park Systems team for your active participation, valuable contributions, and continued trust. Together, we are building stronger partnerships and driving innovation throughout the region.

We're excited to turn these discussions into action and look forward to another year of growth, collaboration, and success.

31/07/2026

[𝗗𝗛𝗠 𝗪𝗲𝗲𝗸: 𝗜𝗻-𝗦𝗶𝘁𝘂 𝗠𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆: 𝗜𝗻-𝗦𝗶𝘁𝘂 𝗧𝗿𝗶𝗯𝗼𝗹𝗼𝗴𝘆 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟱]
Wear evolves during motion, but many surface measurement techniques require to stop the wearing process.
𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠) can be integrated into tribological test systems to monitor surface evolution in situ and in real time. Studies report that DHM was used in a high-vacuum, high-temperature ball-on-disk tribometer to observe wear-track evolution without interrupting the experiment (Meylan et al., Surface Topography: Metrology and Properties, 2017).
In 4D tribology applications, 𝗗𝗛𝗠 𝗲𝗻𝗮𝗯𝗹𝗲𝘀 𝘀𝘆𝗻𝗰𝗵𝗿𝗼𝗻𝗶𝘇𝗲𝗱, 𝗶𝗻-𝘀𝗶𝘁𝘂 𝘁𝗼𝗽𝗼𝗴𝗿𝗮𝗽𝗵𝘆 𝗺𝗲𝗮𝘀𝘂𝗿𝗲𝗺𝗲𝗻𝘁𝘀 𝗼𝗻 𝗺𝗼𝘃𝗶𝗻𝗴 𝘀𝗮𝗺𝗽𝗹𝗲𝘀, allowing the same wear-track position to be monitored repeatedly as friction, wear, and surface deformation evolve over time.

This makes it possible to connect tribological behavior with real-time 3D surface changes instead of relying only on post-test inspection.

💡 Learn more: https://okt.to/T3aiZ2
💡 Explore our DHM products: https://okt.to/zWrLda

Image Caption: Wear-track evolution without stopping the test

30/07/2026

[𝗗𝗛𝗠 𝗪𝗲𝗲𝗸: 𝗜𝗻-𝗦𝗶𝘁𝘂 𝗠𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆: 𝗠𝗘𝗠𝗦 𝗶𝗻 𝗟𝗶𝗾𝘂𝗶𝗱 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟰]
How do you measure a moving MEMS device without opening the package, draining the liquid, or losing dynamic information?

𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠) captures full-field 3D topography without mechanical scanning, making it well suited for dynamic MEMS characterization under operating conditions. Lyncée Tec’s Holographic MEMS Analyzer supports reflection and transmission DHM configurations with long working distance, immersion, and glass-corrected objectives for measurements in the presence of probes, in liquid, and through transparent covers. The stroboscopic unit synchronizes MEMS excitation with 3D topography time sequences and electrical response measurements.

For packaged 𝗠𝗘𝗠𝗦, 𝗺𝗶𝗰𝗿𝗼𝗳𝗹𝘂𝗶𝗱𝗶𝗰 𝗱𝗲𝘃𝗶𝗰𝗲𝘀, 𝗮𝗻𝗱 𝗹𝗶𝗾𝘂𝗶𝗱-𝗮𝗰𝘁𝘂𝗮𝘁𝗲𝗱 𝘀𝘆𝘀𝘁𝗲𝗺𝘀, 𝗗𝗛𝗠 𝗯𝗿𝗶𝗻𝗴𝘀 𝗺𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆 𝗰𝗹𝗼𝘀𝗲𝗿 𝘁𝗼 𝗿𝗲𝗮𝗹 𝗼𝗽𝗲𝗿𝗮𝘁𝗶𝗻𝗴 𝗰𝗼𝗻𝗱𝗶𝘁𝗶𝗼𝗻𝘀.

💡 𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲: https://okt.to/JTzv91
💡 𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗼𝘂𝗿 𝗗𝗛𝗠 𝗽𝗿𝗼𝗱𝘂𝗰𝘁𝘀: https://okt.to/U08aBe

𝗜𝗺𝗮𝗴𝗲 𝗖𝗮𝗽𝘁𝗶𝗼𝗻: Full-field DHM vibration maps of a cMUT membrane in liquid, revealing frequency-dependent motion across the entire device surface

29/07/2026

[𝗗𝗛𝗠 𝗪𝗲𝗲𝗸: 𝗜𝗻-𝗦𝗶𝘁𝘂 𝗠𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆: 𝗠𝗶𝗻𝗲𝗿𝗮𝗹 𝗗𝗶𝘀𝘀𝗼𝗹𝘂𝘁𝗶𝗼𝗻 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟯]
Dissolution rates are often treated as averaged values, but real surfaces dissolve locally, at steps, pits, defects, and flowing-liquid interfaces.

𝗥𝗲𝗳𝗹𝗲𝗰𝘁𝗶𝗼𝗻 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝗲 (𝗗𝗛𝗠) enables in-situ, real-time nanoscale topography monitoring of mineral surfaces in water. Studies report that in gypsum, DHM measures absolute retreat rates of cleavage surfaces, etch pits, steps, and apparently defect-free regions in flowing water. In calcite, DHM tracks real-time nanoscale topography evolution in static or flowing deionized water and measures dissolution rates from surface-normal height changes or volume changes.
For geochemistry, cement, and reactive surfaces, 𝗗𝗛𝗠 𝗯𝗿𝗶𝗻𝗴𝘀 𝗸𝗶𝗻𝗲𝘁𝗶𝗰𝘀 𝗯𝗮𝗰𝗸 𝘁𝗼 𝘁𝗵𝗲 𝘀𝘂𝗿𝗳𝗮𝗰𝗲 𝘄𝗵𝗲𝗿𝗲 𝘁𝗵𝗲𝘆 𝗼𝗰𝗰𝘂𝗿.

💡 𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗽𝗮𝗽𝗲𝗿𝘀: https://okt.to/8bMZWD
https://okt.to/wQp0lB
💡 𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗼𝘂𝗿 𝗗𝗛𝗠 𝗽𝗿𝗼𝗱𝘂𝗰𝘁𝘀: https://okt.to/k8JEt0

𝗜𝗺𝗮𝗴𝗲 𝗖𝗮𝗽𝘁𝗶𝗼𝗻/𝗖𝗿𝗲𝗱𝗶𝘁: Gypsum dissolution in flowing water: nanoscale surface retreat measured by DHM, Feng et al., Chemical Geology, 2017

28/07/2026

[𝗗𝗛𝗠 𝗪𝗲𝗲𝗸: 𝗜𝗻-𝗦𝗶𝘁𝘂 𝗠𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆: 𝗖𝗼𝗿𝗿𝗼𝘀𝗶𝗼𝗻 𝗜𝗻𝘁𝗲𝗿𝗳𝗮𝗰𝗲𝘀 / 𝗘𝗽𝗶𝘀𝗼𝗱𝗲 𝟮]
Corrosion starts at buried interfaces, but most tools show the damage after it has already developed.

𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠) can visualize dynamic concentration and phase changes at the electrode-electrolyte interface in real time. In Electrochemistry Communications (2009) paper, Yuan et al. reports that in copper chloride media, digital holography reconstructs quantitative phase maps during anodic dissolution and reveals diffusion-layer evolution across different polarization regimes. The study supports that Cu⁺ forms first at the initial stage, before reacting into cuprous chloride and chloride complexes.

For corrosion science, this means 𝗗𝗛𝗠 𝗰𝗮𝗻 𝗵𝗲𝗹𝗽 𝗰𝗼𝗻𝗻𝗲𝗰𝘁 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝗰𝗮𝗹 𝘀𝗶𝗴𝗻𝗮𝗹𝘀 𝘄𝗶𝘁𝗵 𝘀𝗽𝗮𝘁𝗶𝗮𝗹𝗹𝘆 𝗿𝗲𝘀𝗼𝗹𝘃𝗲𝗱 𝗶𝗻𝘁𝗲𝗿𝗳𝗮𝗰𝗶𝗮𝗹 𝗱𝘆𝗻𝗮𝗺𝗶𝗰𝘀.

What corrosion mechanism would you want to see in real time?

💡 𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗽𝗮𝗽𝗲𝗿: https://okt.to/Le7IuK
💡 𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗼𝘂𝗿 𝗗𝗛𝗠 products:https://okt.to/TKNH6k

Image Caption/Credit: Seeing the diffusion layer during anodic dissolution, Yuan et al., Electrochemistry Communications, 2009

Address

Suwon
16229

Website

https://www.parksystems.com/

Alerts

Be the first to know and let us send you an email when Park Systems posts news and promotions. Your email address will not be used for any other purpose, and you can unsubscribe at any time.

Contact The Business

Send a message to Park Systems:

Park Systems

07/08/2026

06/08/2026

04/08/2026

04/08/2026

03/08/2026

01/08/2026

31/07/2026

30/07/2026

29/07/2026

28/07/2026

Address

Website

Alerts

Contact The Business

Shortcuts

Share

Listing takedown request