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Enabling Nanoscale Advances
Park Systems has always strived to push the limits of innovation in scan

Park Systems, formally PSIA, is an innovative leader in atomic force microscopy. We are committed to providing accurate yet easy to use AFMs. With features like True Non-Contact™ mode and automated software, we continue to achieve our goals of improving our products. Headquartered in South Korea, Park Systems also hosts offices in the United States, Germany, China, Mexico, Singapore, India and Japan.

10/10/2026

[Press Release] Park Systems 𝗹𝗲𝗮𝗱𝘀 𝘁𝗵𝗲 𝗴𝗹𝗼𝗯𝗮𝗹 𝗔𝗙𝗠 𝗺𝗮𝗿𝗸𝗲𝘁 by revenue for the fourth consecutive year (2022–2025), according to QY Research AFM Market Report. With 23.8% of global AFM revenue and 340 systems sold in 2025, the company ranked first in revenue and unit shipments.

Building on this leadership, Park Systems has expanded its research-grade AFM portfolio with 𝗡𝗫𝟭 𝗳𝗼𝗿 𝗮𝘁𝗼𝗺𝗶𝗰-𝘀𝗰𝗮𝗹𝗲 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 under ambient conditions, while broadening its capabilities through 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗲𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 (𝗜𝗦𝗘) and 𝗱𝗶𝗴𝗶𝘁𝗮𝗹 𝗵𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠).

These developments come as the global AFM market is forecast to grow from $508.69 million in 2025 to $1.01 billion by 2032, at a compound annual growth rate of 11.23%.

💡𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗳𝘂𝗹𝗹 𝗽𝗿𝗲𝘀𝘀 𝗿𝗲𝗹𝗲𝗮𝘀𝗲: https://okt.to/DLJ4PC

09/10/2026

They did it again! 💪🏃
Another year, another 𝗚ö𝘁𝘁𝗶𝗻𝗴𝗲𝗻 𝗢𝗯𝘀𝘁𝗮𝗰𝗹𝗲 𝗖𝗶𝘁𝘆 𝗥𝘂𝗻 for the 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗔𝗰𝗰𝘂𝗿𝗶𝗼𝗻 𝘁𝗲𝗮𝗺. This time, 18 colleagues faced 6 km and 21 obstacles, pushing through nearly three hours of running, climbing, crawling, water, mud and plenty of teamwork.

A tough challenge, a strong team and one more finish line crossed together. Congratulations to everyone who took part and brought the Park Systems team spirit to the course! 🎉
Already wondering what challenge comes next... 😎

08/10/2026

One technique rarely answers every question in a complex sample.
𝗔𝘁𝗼𝗺𝗶𝗰 𝗙𝗼𝗿𝗰𝗲 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗡𝗮𝗻𝗼-𝗜𝗥 𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝘆, 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 and 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 reveal complementary information: from structure and chemistry to thin-film properties and dynamics.

🔔Follow Park Systems for multimodal measurement ideas you can apply in the lab.

07/10/2026

The CAS International Semiconductor Conference brings together researchers and engineers working across semiconductor devices, micro- and nanosystems, MEMS, sensors and advanced materials.

We are also pleased to contribute to the scientific program with a plenary presentation by 𝗗𝗿. 𝗝𝗮𝗺𝗲𝘀 𝗞𝗲𝗿𝗳𝗼𝗼𝘁, Park Systems UK Ltd.:

"𝗔𝘁𝗼𝗺𝗶𝗰 𝗙𝗼𝗿𝗰𝗲 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 𝗳𝗼𝗿 𝗡𝗮𝗻𝗼𝘀𝗰𝗮𝗹𝗲 𝗠𝗼𝗿𝗽𝗵𝗼𝗹𝗼𝗴𝗶𝗰𝗮𝗹 𝗮𝗻𝗱 𝗘𝗹𝗲𝗰𝘁𝗿𝗶𝗰𝗮𝗹 𝗖𝗵𝗮𝗿𝗮𝗰𝘁𝗲𝗿𝗶𝘀𝗮𝘁𝗶𝗼𝗻 𝗼𝗳 𝗦𝗲𝗺𝗶𝗰𝗼𝗻𝗱𝘂𝗰𝘁𝗼𝗿𝘀"
Thursday, October 15 | 10:00 | Room 1

The talk will explore emerging AFM applications including ferroelectric and memristive devices, dopant and carrier mapping, buried-interface characterization, and nanoscale chemical analysis using nano-IR spectroscopy.

Join us to discuss characterization solutions for semiconductor and MEMS research, including Atomic Force Microscopy (AFM) for nanoscale morphological, electrical and chemical analysis, and Digital Holographic Microscopy (DHM) for dynamic MEMS characterization.

If you are attending CAS 2026, visit us and SEE Srl to discuss your semiconductor, MEMS and nanoscale characterization challenges.

💡𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗦𝗼𝗹𝘂𝘁𝗶𝗼𝗻𝘀: https://okt.to/prqcIz

06/10/2026

Join our upcoming webinar to discover how 𝗜𝗺𝗮𝗴𝗶𝗻𝗴 𝗦𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 (𝗜𝗦𝗘) enables high-resolution, non-destructive characterization of oxide thin films.
Learn how ISE combines spatially resolved Ψ and Δ measurements with pixel-wise optical modeling to map film thickness and optical properties and identify local non-uniformity, thickness gradients, and process-induced variations.

📅 October 27, 2026
🔗 𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝗻𝗼𝘄: https://okt.to/yTkD0A

05/10/2026

What does fully automated AFM metrology look like? From wafer loading to analysis, 𝗣𝗮𝗿𝗸 𝗡𝗫-𝗪𝗮𝗳𝗲𝗿 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗲𝘀 𝗲𝗮𝗰𝗵 𝗸𝗲𝘆 𝘀𝘁𝗲𝗽: receiving the host recipe, selecting the probe, aligning the wafer, moving to target sites, measuring and reporting.

Reduce manual intervention and bring repeatable nanoscale metrology into semiconductor production.

💡𝗦𝗲𝗲 𝘁𝗵𝗲 𝘄𝗼𝗿𝗸𝗳𝗹𝗼𝘄. 𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲: https://okt.to/iyw7g4

02/10/2026

We were excited to meet so many researchers in Boston and see our tools in action at 𝗡𝗔𝗡𝗢𝘀𝗰𝗶𝗲𝗻𝘁𝗶𝗳𝗶𝗰 𝗦𝘆𝗺𝗽𝗼𝘀𝗶𝘂𝗺 𝗔𝗺𝗲𝗿𝗶𝗰𝗮𝘀 𝟮𝟬𝟮𝟲.
Park Systems supported live demonstrations and hands-on sessions with advanced AFM, Digital Holographic Microscopy, and Imaging Spectroscopic Ellipsometry.

It was great to see participants testing workflows, asking detailed questions, and discussing real applications directly with our team.

We were also pleased to sponsor the 𝗕𝗲𝘀𝘁 𝗣𝗼𝘀𝘁𝗲𝗿 𝗔𝘄𝗮𝗿d and recognize outstanding research presented during the symposium.

Symposium ”

01/10/2026

How can Piezoresponse Force Microscopy (PFM) reveal the electromechanical behavior of piezoelectric and ferroelectric materials at the nanoscale? Join our webinar to explore the fundamentals of PFM and the evolution of advanced measurement techniques, from conventional Off-Resonance PFM to Contact-Resonance PFM and DFRT-PFM.

Discover how PFM amplitude and phase imaging can help investigate local piezoelectric responses, ferroelectric domain structures, domain switching behavior, and nanoscale electromechanical properties.

📅 October 13, 2026

🔗 𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝗻𝗼𝘄: https://okt.to/6GC3Pz

30/09/2026

𝗛𝗼𝘄 𝘀𝗺𝗮𝗹𝗹 𝗮 𝘃𝗶𝗯𝗿𝗮𝘁𝗶𝗼𝗻 𝗰𝗮𝗻 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠) 𝗿𝗲𝗹𝗶𝗮𝗯𝗹𝘆 𝗺𝗲𝗮𝘀𝘂𝗿𝗲? In Journal of Physics: Photonics, authors address a key challenge in MEMS vibration mapping: separating real nanoscale motion from measurement noise. They define a rigorous way to determine the DHM detection limit, show how experimental settings affect it, and propose a metric for comparing systems.

To validate their approach, the researchers measured the vibration mode of a phononic crystal, an experiment requiring a 𝗱𝗲𝘁𝗲𝗰𝘁𝗶𝗼𝗻 𝗹𝗲𝘃𝗲𝗹 𝗼𝗳 𝗷𝘂𝘀𝘁 𝟭 𝗽𝗶𝗰𝗼𝗺𝗲𝘁𝗲𝗿. This resolution is 𝗳𝗿𝗲𝗾𝘂𝗲𝗻𝗰𝘆 𝗮𝗻𝗱 𝗺𝗲𝗮𝘀𝘂𝗿𝗲𝗺𝗲𝗻𝘁 𝗯𝗮𝗻𝗱𝘄𝗶𝗱𝘁𝗵 𝗶𝗻𝗱𝗲𝗽𝗲𝗻𝗱𝗲𝗻𝘁.

Because DHM 𝗰𝗮𝗽𝘁𝘂𝗿𝗲𝘀 𝘁𝗵𝗲 𝗲𝗻𝘁𝗶𝗿𝗲 𝗳𝗶𝗲𝗹𝗱 𝗼𝗳 𝘃𝗶𝗲𝘄 simultaneously, it reveals such small vibration patterns across the structure extremely rapidly, 𝘄𝗶𝘁𝗵𝗼𝘂𝘁 𝗽𝗼𝗶𝗻𝘁-𝗯𝘆-𝗽𝗼𝗶𝗻𝘁 𝘀𝗰𝗮𝗻𝗻𝗶𝗻𝗴

This approach can support more reliable characterization of 𝗠𝗘𝗠𝗦, 𝗺𝗶𝗰𝗿𝗼𝘀𝗲𝗻𝘀𝗼𝗿𝘀, 𝗿𝗲𝘀𝗼𝗻𝗮𝘁𝗼𝗿𝘀, 𝘂𝗹𝘁𝗿𝗮𝘀𝗼𝗻𝗶𝗰 𝗱𝗲𝘃𝗶𝗰𝗲𝘀 𝗮𝗻𝗱 𝗽𝗵𝗼𝗻𝗼𝗻𝗶𝗰 𝘀𝘁𝗿𝘂𝗰𝘁𝘂𝗿𝗲𝘀.

📜𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗳𝘂𝗹𝗹 𝗽𝗮𝗽𝗲𝗿: https://okt.to/4t76TM
💡𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝗿𝗲𝗹𝗮𝘁𝗲𝗱 𝗗𝗛𝗠 𝗮𝗽𝗽𝗹𝗶𝗰𝗮𝘁𝗶𝗼𝗻𝘀: https://okt.to/V67tRI

Image caption: DHM vibration-amplitude map of a phononic crystal used to validate picometer-scale detection, with vibration at a resonance node measured down to 1.26 pm.

29/09/2026

𝗪𝗵𝗮𝘁 𝗵𝗮𝗽𝗽𝗲𝗻𝘀 𝗮𝘁 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗱𝗲 𝗶𝗻𝘁𝗲𝗿𝗳𝗮𝗰𝗲𝘀 𝗰𝗮𝗻 𝗱𝗲𝘁𝗲𝗿𝗺𝗶𝗻𝗲 𝗵𝗼𝘄 𝘁𝗵𝗲 𝗲𝗻𝘁𝗶𝗿𝗲 𝗯𝗮𝘁𝘁𝗲𝗿𝘆 𝗽𝗲𝗿𝗳𝗼𝗿𝗺𝘀.
In this webinar, explore how 𝘀𝗰𝗮𝗻𝗻𝗶𝗻𝗴 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝗰𝗮𝗹 𝗽𝗿𝗼𝗯𝗲 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗦𝗘𝗣𝗠) techniques and 𝗔𝗙𝗠-𝗯𝗮𝘀𝗲𝗱 𝗺𝗲𝘁𝗵𝗼𝗱𝘀 reveal interfacial and interphase processes that are difficult to capture with alternative techniques. See how nanoscale measurements 𝗰𝗼𝗻𝗻𝗲𝗰𝘁 𝘀𝘂𝗿𝗳𝗮𝗰𝗲 𝗺𝗼𝗿𝗽𝗵𝗼𝗹𝗼𝗴𝘆, 𝗺𝗲𝗰𝗵𝗮𝗻𝗶𝗰𝗮𝗹 𝗽𝗿𝗼𝗽𝗲𝗿𝘁𝗶𝗲𝘀 𝗮𝗻𝗱 𝗲𝗹𝗲𝗰𝘁𝗿𝗼𝗰𝗵𝗲𝗺𝗶𝗰𝗮𝗹 𝗯𝗲𝗵𝗮𝘃𝗶𝗼𝗿 in emerging battery materials.

🎤𝗦𝗽𝗲𝗮𝗸𝗲𝗿: Prof. Prof. Dr. Kranz, Ulm University, Germany
👉𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝗻𝗼𝘄: https://okt.to/iBuwSr

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